De novo Assembly III

Guest lecturer: Stefan Prost, stefan.prost@berkley.edu

Error Correction (EC) using the k-mer spectrum
EC Using Kmer Counts
Adapter and Low Quality Base Trimming
Contamination Filtering
de Bruijn Graph
Short Read Assembler
Software Specifics
N50
Assembly Quality Assessment
Gap Filling
Resolving Mis-Assemblies
Genome Merging
Overall
Downstream Processing